GaN polarity domains spatially resolved by x-ray standing wave microscopy

Journal of Physics D: Applied Physics

Volumn 36, Issue 10 A, 2003, Pages

  Drakopoulos, M ^a   Zegenhagen, J ^a   Lee, T L ^a   Snigirev, A ^a   Snigireva, I ^a   Cimalla, V ^b   Ambacher, O ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; FLUORESCENCE; GALLIUM NITRIDE; LENSES; MICROSCOPIC EXAMINATION; OPTICAL RESOLVING POWER; PHOTOREFRACTIVE MATERIALS; REFLECTION; SINGLE CRYSTALS; X RAYS;

ADVANCED MICROPROBE TECHNIQUE; BRAGG REFLECTION; CRYSTALLOGRAPHIC POLARITY; REFRACTIVE LENS; SPATIAL RESOLUTION; X RAY STANDING WAVE MICROSCOPY;

X RAY CRYSTALLOGRAPHY;

EID: 0037945608     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/10A/344     Document Type: Article

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