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Physical Review Letters

Volumn 86, Issue 23, 2001, Pages 5329-5332

X-ray standing wave analysis of the effect of isotopic composition on the lattice constants of Si and Ge

(7) Sozontov, E a Cao, L X a,b Kazimirov, A c Kohn, V d Konuma, M a Cardona, M a Zegenhagen, J a,b

a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c Department of Obstetrics Gynecology (United States)

d KURCHATOV INSTITUTE (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DIAMONDS; ELECTRONIC STRUCTURE; GERMANIUM; ISOTOPES; PHOTOEMISSION; SILICON; SINGLE CRYSTALS; STANDING WAVE METERS; X RAY DIFFRACTION ANALYSIS;

X-RAY STANDING WAVE (XSW) ANALYSIS;

LATTICE CONSTANTS;

EID: 0035805802 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.86.5329 Document Type: Article

Times cited : (46)

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