Polarity determination of a GaN thin film on sapphire (0001) with x-ray standing waves

Journal of Applied Physics

Volumn 84, Issue 3, 1998, Pages 1703-1705

  Kazimirov, A ^a,d   Scherb, G ^a   Zegenhagen, J ^a   Lee, T L ^b   Bedzyk, M J ^b   Kelly, M K ^c   Angerer, H ^c   Ambacher, O ^c  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

^b NORTHWESTERN UNIVERSITY   (United States)

^c WALTER SCHOTTKY INSTITUT   (Germany)

^d Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001631043     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368240     Document Type: Article

References (24)

1. B. Daudin, J. L. Rouviére, and M. Arley, Appl. Phys. Lett. 69, 2480 (1996).
2. M. Seelmann-Eggebert, J. L. Weyher, H. Obloh, H. Zimmermann, A. Rar, and S. Porowski, Appl. Phys. Lett. 71, 2635 (1997).
3. P. F. Fewster and P. A. C. Whiffin, J. Appl. Phys. 54, 4668 (1983).
4. Y.-C. Lu, C. M. Stahle, J. Morimoto, R. H. Bube, and R. S. Feigelson, J. Appl. Phys. 61, 924 (1987).
5. E. A. Hewat, L. DiCioccio, A. Million, M. Dupuy, and J. P. Gailliard, J. Appl. Phys. 63, 4929 (1988).
6. A. C. Chami, E. Ligeon, R. Danielou, and J. Fontenille, Appl. Phys. Lett. 52, 1502 (1988).
7. B. W. Batterman, Phys. Rev. Lett. 22, 703 (1969).
8. J. Zegenhagen, Surf. Sci. Rep. 18, 199 (1993).
9. P. Trucano, Phys. Rev. B 13, 2524 (1976).
10. T. Takahashi and S. Kikuta, J. Phys. Soc. Jpn. 47, 620 (1979).
11. S. Annaka, T. Takahashi, and S. Kikuta, Jpn. J. Appl. Phys., Part 1 23, 1637 (1984).
12. J. R. Patel and J. A. Golovchenko, Phys. Rev. Lett. 50, 1858 (1983).
13. B. G. Zakharov, A. Yu. Kazimirov, V. G. Kohn, E. A. Sazontov, and A. N. Sosphenov, Sov. Tech. Phys. Lett. 15, 31 (1989).
14. Max von Laue, Röntgenstrahlinterferenzen (Akademische Verlagsgesellschaft, Frankfurt am Main, Germany, 1960).
15. M. J. Bedzyk, G. Materlik, and M. V. Kovalchuk, Phys. Rev. B 30, 2453 (1984); M. J. Bedzyk and G. Materlik, ibid. 32, 6456 (1985).
16. M. J. Bedzyk, G. Materlik, and M. V. Kovalchuk, Phys. Rev. B 30, 2453 (1984); M. J. Bedzyk and G. Materlik, ibid. 32, 6456 (1985).
17. Ga)] (see Ref. 15).
18. Below a certain thickness the formalism of the x-ray dynamical theory asymptotically approaches the formalism of the kinematical theory, which renders calculations much easier.
19. A. Yu. Kazimirov, M. V. Kovalchuk, and V. G. Kohn, Sov. Tech. Phys. Lett. 14, 587 (1988).
20. A. Yu. Kazimirov, M. V. Kovalchuk, A. N. Sosphenov, V. G. Kohn, J. Kub, P. Novak, and M. Nerviva, Acta Crystallogr., Sect. B: Struct. Sci. 48, 577 (1992).
21. A. Kazimirov, T. Haage, L. Ortega, A. Stierle, F. Comin, and J. Zegenhagen, Solid State Commun. 104, 347 (1997).
22. H. Angerer, O. Ambacher, R. Dimitrov, T. Metzger, W. Rieger, and M. Stutzmann, MRS Internet J. Nitride Semicond. Res. 1, 15 (1996).
23. M. V. Kovalchuk, V. G. Kohn, and E. F. Lobanovich, Sov. Phys. Solid State 27, 2034 (1985).
24. While the manuscript was prepared for publication N polarity of MBE grown films was suggested in the work of A. R. Smith, R. M. Feenstra, D. W. Greve, J. Neugebauer, and J. E. Northrup, Phys. Rev. Lett. 79, 3934 (1997), which studied reconstructions of GaN thin film surfaces.