Domain pattern formation in epitaxial rhombohedral ferroelectric films. II. Interfacial defects and energetics

Journal of Applied Physics

Volumn 83, Issue 5, 1998, Pages 2754-2765

  Romanov, A E ^a,f   Lefevre, M J ^b   Speck, J S ^b   Pompe, W ^c   Streiffer, S K ^d   Foster, C M ^e  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b University of California   (United States)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^d North Carolina State University   (United States)

^e ARGONNE NATIONAL LABORATORY   (United States)

^f IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001239561     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366636     Document Type: Article

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