Direct observation of lateral current spreading in ridge waveguide lasers using scanning voltage microscopy

Applied Physics Letters

Volumn 82, Issue 23, 2003, Pages 4166-4168

  Ban, D ^a,c   Sargent, E H ^a   Hinzer, K ^b   Dixon Warren, St J ^b   SpringThorpe, A J ^a,c   White, J K ^b  

^a UNIVERSITY OF TORONTO   (Canada)

^b NORTEL NETWORKS   (Canada)

^c NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; FABRICATION; INTERFACES (MATERIALS); OPTICAL COMMUNICATION; OPTIMIZATION; OPTOELECTRONIC DEVICES; SEMICONDUCTING INDIUM GALLIUM ARSENIDE;

SCANNING VOLTAGE MICROSCOPY;

QUANTUM WELL LASERS;

EID: 0037828686     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1581982     Document Type: Article

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