Analysis of breakdown probabilities in avalanche photodiodes using a history-dependent analytical model

Applied Physics Letters

Volumn 82, Issue 12, 2003, Pages 1971-1973

  Wang, Shuling ^a   Ma, Feng ^a   Li, Xiaowei ^a   Karve, Gauri ^a   Zheng, Xiaoguang ^a   Campbell, Joe C ^a  

^a The University of Texas at Austin   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; GEIGER COUNTERS; IMPACT IONIZATION; MONTE CARLO METHODS; SEMICONDUCTING GALLIUM ARSENIDE;

TELECOMMUNICATION WAVELENGTHS;

PHOTODIODES;

EID: 0037464240     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1559946     Document Type: Article

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