CW and nano-second laser irradiation on materials: Elements of comparison of thermal effects

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4347, Issue , 2001, Pages 502-508

  Gallais, L ^a   Natoli, J Y ^a   Akhouayri, H ^a   Amra, C ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

CW and pulsed laser; Damage morphology; Low threshold; Photothermal measurements

Indexed keywords

ABSORPTION; ATOMIC FORCE MICROSCOPY; CONTINUOUS WAVE LASERS; IRRADIATION; LASER PULSES; PULSE AMPLIFIERS; THERMAL EFFECTS;

CONTINUOUS WAVE (CW) PUMPS;

LASER DAMAGE;

EID: 0034847994     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.425019     Document Type: Conference Paper

References (8)

1. Single-beam photothermal microscopy - A new diagnostic tool for optical material
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7. Localized laser damage test facility at LOSCM: Real time observation and quantitative AFM study