Nanoscale structuring by misfit dislocations in Si1−xGex/Si epitaxial systems

Physical Review Letters

Volumn 78, Issue 3, 1997, Pages 503-506

  Shiryaev, S Yu ^a   Jensen, F ^b   Hansen, J Lundsgaard ^a   Petersen, J Wulff ^b   Larsen, A Nylandsted ^a  

^a AARHUS UNIVERSITY   (Denmark)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000609724     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.503     Document Type: Article

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