|
Volumn 82, Issue 1, 2000, Pages 286-290
|
Tensile testing of insulating thin films; Humidity effect on tensile strength of SiO2 films
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATMOSPHERIC HUMIDITY;
FRACTURE TOUGHNESS;
PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;
SILICA;
TENSILE STRENGTH;
TENSILE TESTING;
THIN FILMS;
HUMIDITY EFFECT;
THERMAL INSULATING MATERIALS;
|
EID: 0033731036
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/S0924-4247(99)00363-5 Document Type: Article |
Times cited : (76)
|
References (6)
|