-
2
-
-
0027850133
-
Undulator radiation for at-wavelength interferometry of optics for extreme-ultraviolet lithography
-
D. Attwood, G. Sommargren, R. Beguiristain, K. Nguyen, J. Bokor, N. Ceglio, K. Jackson, M. Koike, and J. Underwood, “Undulator radiation for at-wavelength interferometry of optics for extreme-ultraviolet lithography,” Appl. Opt. 32, 7022-7031 (1993).
-
(1993)
Appl. Opt.
, vol.32
, pp. 7022-7031
-
-
Attwood, D.1
Sommargren, G.2
Beguiristain, R.3
Nguyen, K.4
Bokor, J.5
Ceglio, N.6
Jackson, K.7
Koike, M.8
Underwood, J.9
-
3
-
-
0032402532
-
-
Emerging Lithographic Technologies II, Y. Vladimirsky, ed., Proc. SPIE
-
D. W. Sweeney, R. Hudyma, H. N. Chapman, and D. Shafer, “EUV optical design for a 100 nm CD imaging system,” in Emerging Lithographic Technologies II, Y. Vladimirsky, ed., Proc. SPIE 3331, 2-10 (1998).
-
(1998)
EUV Optical Design for a 100 Nm CD Imaging System
, vol.3331
, pp. 2-10
-
-
Sweeney, D.W.1
Hudyma, R.2
Chapman, H.N.3
Shafer, D.4
-
4
-
-
0004224256
-
-
Wiley, New York, 1986Chap. 5
-
J. W. Goodman, Statistical Optics, (Wiley, New York, 1986) Chap. 5, pp. 157-229.
-
Statistical Optics
, pp. 157-229
-
-
Goodman, J.W.1
-
5
-
-
0001452790
-
Interference between wave fronts rotated or reversed with respect to each other and its relation to spatial coherence
-
M. V. R. K. Murty, “Interference between wave fronts rotated or reversed with respect to each other and its relation to spatial coherence,” J. Opt. Soc. Am. 54, 1187-1190 (1964).
-
(1964)
J. Opt. Soc. Am.
, vol.54
, pp. 1187-1190
-
-
Murty, M.V.R.K.1
-
6
-
-
84953654680
-
Coherence and Fluctuations in Light Beams
-
W. Martienssen and E. Spiller, “Coherence and Fluctuations in Light Beams,” Am. J. Phys. 32, 919-926 (1964).
-
(1964)
Am. J. Phys.
, vol.32
, pp. 919-926
-
-
Martienssen, W.1
Spiller, E.2
-
7
-
-
0018545567
-
Illumination with a moving light source
-
K. Itoh and Y. Ohtsuka, “Illumination with a moving light source,” Opt. Commun. 31, 119-124 (1979).
-
(1979)
Opt. Commun.
, vol.31
, pp. 119-124
-
-
Itoh, K.1
Ohtsuka, Y.2
-
8
-
-
0019054773
-
Coherence control by laser scanning
-
K. Itoh and Y. Ohtsuka, “Coherence control by laser scanning,” Appl. Opt. 19, 3184-3188 (1980).
-
(1980)
Appl. Opt.
, vol.19
, pp. 3184-3188
-
-
Itoh, K.1
Ohtsuka, Y.2
-
9
-
-
0030079682
-
Lensless imaging by spatial Fourier synthesis holography
-
E. Arons and D. Dilworth, “Lensless imaging by spatial Fourier synthesis holography,” Appl. Opt. 35, 777-781 (1996).
-
(1996)
Appl. Opt.
, vol.35
, pp. 777-781
-
-
Arons, E.1
Dilworth, D.2
-
10
-
-
0029288967
-
Analysis of Fourier synthesis holography for imaging through scattering media
-
E. Arons and D. Dilworth, “Analysis of Fourier synthesis holography for imaging through scattering media,” Appl. Opt. 34, 1841-1847 (1995).
-
(1995)
Appl. Opt.
, vol.34
, pp. 1841-1847
-
-
Arons, E.1
Dilworth, D.2
-
11
-
-
0031563702
-
Analysis of the confined-reference coherenceencoding method for image transmission through optical fibers
-
P. Naulleau, “Analysis of the confined-reference coherenceencoding method for image transmission through optical fibers,” Appl. Opt. 36, 7386-7396 (1997).
-
(1997)
Appl. Opt.
, vol.36
, pp. 7386-7396
-
-
Naulleau, P.1
-
12
-
-
0001034734
-
Spatial coherence characterization of undulator radiation
-
C. Chang, P. Naulleau, E. Anderson, and D. Attwood, “Spatial coherence characterization of undulator radiation,” Opt. Commun. 182, 24-34 (2000).
-
(2000)
Opt. Commun.
, vol.182
, pp. 24-34
-
-
Chang, C.1
Naulleau, P.2
Anderson, E.3
Attwood, D.4
-
13
-
-
0036380126
-
Honing the accuracy of extreme ultraviolet optical system testing: At-wavelength and visible-light measurements of the ETS Set-2 projection optic
-
R. L. Engelstad, ed., Proc. SPIE
-
K. Goldberg, P. Naulleau, J. Bokor, and H. Chapman, “Honing the accuracy of extreme ultraviolet optical system testing: at-wavelength and visible-light measurements of the ETS Set-2 projection optic,” In Emerging Lithographic Technologies VI, R. L. Engelstad, ed., Proc. SPIE 4688, (2002).
-
(2002)
Emerging Lithographic Technologies VI
, vol.4688
-
-
Goldberg, K.1
Naulleau, P.2
Bokor, J.3
Chapman, H.4
-
14
-
-
0035519498
-
At wavelength characterization of the Engineering Test Stand Set-2 optic, J. Vac
-
P. Naulleau, K. Goldberg, E. Anderson, P. Batson, P. Denham, S. Rekawa, and J. Bokor, “At wavelength characterization of the Engineering Test Stand Set-2 optic,” J. Vac. Sci. Technol. B 19, 2396-2400 (2001).
-
(2001)
Sci. Technol. B
, vol.19
, pp. 2396-2400
-
-
Naulleau, P.1
Goldberg, K.2
Anderson, E.3
Batson, P.4
Denham, P.5
Rekawa, S.6
Bokor, J.7
-
15
-
-
0001166658
-
Initial Results from the EUV Engineering Test Stand
-
D. A. Tichenor and J. A. Folta, eds., Proc. SPIE
-
D. Tichenor, A. Ray-Chaudhuri, S. Lee, H. Chapman, W. Re-plogle, K. Berger, R. Stulen, G. Kubiak, L. Klebanoff, J. Wronosky, D. O’Connell, A. Leung, K. Jefferson, W. Ballard, L. Hale, K. Blaedel, J. Taylor, J. Folta, E. Spiller, R. Soufli, G. Sommargren, D. Sweeney, P. Naulleau, K. Goldberg, E. Gul-likson, J. Bokor, D. Attwood, U. Mickan, R. Hanzen, E. Panning, P. Yan, J. Bjorkholm, and C. Gwyn, “Initial Results from the EUV Engineering Test Stand,” in Soft X-Ray and EUV Imaging Systems II, D. A. Tichenor and J. A. Folta, eds., Proc. SPIE 4506, 639-645 (2001).
-
(2001)
Soft X-Ray and EUV Imaging Systems II
, vol.4506
, pp. 639-645
-
-
Tichenor, D.1
Ray-Chaudhuri, A.2
Lee, S.3
Chapman, H.4
Re-Plogle, W.5
Berger, K.6
Stulen, R.7
Kubiak, G.8
Klebanoff, L.9
Wronosky, J.10
O’connell, D.11
Leung, A.12
Jefferson, K.13
Ballard, W.14
Hale, L.15
Blaedel, K.16
Taylor, J.17
Folta, J.18
Spiller, E.19
Soufli, R.20
Sommargren, G.21
Sweeney, D.22
Naulleau, P.23
Goldberg, K.24
Gul-Likson, E.25
Bokor, J.26
Attwood, D.27
Mickan, U.28
Hanzen, R.29
Panning, E.30
Yan, P.31
Bjorkholm, J.32
Gwyn, C.33
more..
-
16
-
-
0003053929
-
Static microfield printing at the Advanced Light Source with the ETS Set-2 optic
-
R. L. Engelstad, ed., Proc. SPIE
-
P. Naulleau, K. Goldberg, E. Anderson, D. Attwood, P. Batson, J. Bokor, P. Denham, E. Gullikson, B. Hoef, K. Jackson, S. Rekawa, F. Salmassi, K. Blaedel, H. Chapman, L. Hale, R. Soufli, E. Spiller, D. Sweeney, J. Taylor, C. Walton, G. Cardinale, A. Ray-Chaudhuri, A. Fisher, G. Kubiak, D. O’Connell, R. Stulen, D. Tichenor, C. Gwyn, P. Yan, and G. Zhang, “Static microfield printing at the Advanced Light Source with the ETS Set-2 optic,” in Emerging Lithographic Technologies VI, R. L. Engelstad, ed., Proc. SPIE 4688, 64-72 (2002).
-
(2002)
Emerging Lithographic Technologies VI
, vol.4688
, pp. 64-72
-
-
Naulleau, P.1
Goldberg, K.2
Anderson, E.3
Attwood, D.4
Batson, P.5
Bokor, J.6
Denham, P.7
Gullikson, E.8
Hoef, B.9
Jackson, K.10
Rekawa, S.11
Salmassi, F.12
Blaedel, K.13
Chapman, H.14
Hale, L.15
Soufli, R.16
Spiller, E.17
Sweeney, D.18
Taylor, J.19
Walton, C.20
Cardinale, G.21
Ray-Chaudhuri, A.22
Fisher, A.23
Kubiak, G.24
O’connell, D.25
Stulen, R.26
Tichenor, D.27
Gwyn, C.28
Yan, P.29
Zhang, G.30
more..
-
17
-
-
85010145997
-
Sub-70-nm EUV Lithography at the Advanced Light Source Static Microfield Exposure Station Using the ETS Set-2 Optic
-
P. Naulleau, K. Goldberg, E. Anderson, D. Attwood, P. Batson, J. Bokor, P. Denham, E. Gullikson, B. Harteneck, B. Hoef, K. Jackson, D. Olynick, S. Rekawa, F. Salmassi, K. Blaedel, H. Chapman, L. Hale, P. Mirkarimi, R. Soufli, E. Spiller, D. Sweeney, J. Taylor, C. Walton, D. O’Connell, R. Stulen, D. Tichenor, C. Gwyn, P. Yan and G. Zhang, “Sub-70-nm EUV Lithography at the Advanced Light Source Static Microfield Exposure Station Using the ETS Set-2 Optic,” J. Vac. Sci. Technol. B (2002).
-
(2002)
J. Vac. Sci. Technol. B
-
-
Naulleau, P.1
Goldberg, K.2
Anderson, E.3
Attwood, D.4
Batson, P.5
Bokor, J.6
Denham, P.7
Gullikson, E.8
Harteneck, B.9
Hoef, B.10
Jackson, K.11
Olynick, D.12
Rekawa, S.13
Salmassi, F.14
Blaedel, K.15
Chapman, H.16
Hale, L.17
Mirkarimi, P.18
Soufli, R.19
Spiller, E.20
Sweeney, D.21
Taylor, J.22
Walton, C.23
O’connell, D.24
Stulen, R.25
Tichenor, D.26
Gwyn, C.27
Yan, P.28
Zhang, G.29
more..
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