Activation analysis of deformation in evaporated molybdenum thin films

Journal of Physics D: Applied Physics

Volumn 36, Issue 7, 2003, Pages 884-895

  Yoder, K B ^a   Elmustafa, A A ^b   Lin, J C ^c   Hoffman, R A ^d   Stone, D S ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

^b NASA LANGLEY RESEARCH CENTER   (United States)

^c ALCOA TECHNICAL CENTER   (United States)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ANALYSIS; ARGON; DEFORMATION; ELECTRON BEAMS; EVAPORATION; GRAIN SIZE AND SHAPE; ION BOMBARDMENT; MOLYBDENUM; NANOTECHNOLOGY; X RAY DIFFRACTION ANALYSIS;

THERMAL ACTIVATION;

THIN FILMS;

EID: 0037425296     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/7/318     Document Type: Article

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