X-ray photoelectron spectroscopy study of ZnO films grown by metal-organic chemical vapor deposition

Journal of Crystal Growth

Volumn 252, Issue 1-3, 2003, Pages 180-183

  Zhang, Yuantao ^a   Du, Guotong ^a   Wang, Xinqiang ^a   Li, Wancheng ^a   Yang, Xiaotian ^a   Ma, Yan ^a   Zhao, Baijun ^a   Yang, Hongjun ^a   Liu, Dali ^a   Yang, Shuren ^a  

^a JILIN UNIVERSITY   (China)

Author keywords

A3. Metalorganic molecular beam epitaxy; B1. Oxides; B2. Semiconducting II VI materials

Indexed keywords

ANNEALING; METALLORGANIC CHEMICAL VAPOR DEPOSITION; SUBSTRATES; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE;

DIFFRACTION PEAKS;

CRYSTAL GROWTH;

EID: 0037401729     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)02481-8     Document Type: Article

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