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Volumn 66, Issue 1-4, 2003, Pages 415-421
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Chemical vapor deposition of copper thin films for multi-level interconnections
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Author keywords
Chemical vapor deposition; Copper thin films; Multi level interconnection processing; Transmission electron microscopy
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COPPER;
ELECTRIC CONDUCTANCE;
INTERCONNECTION NETWORKS;
TRANSMISSION ELECTRON MICROSCOPY;
MULTI LEVEL INTERCONNECTION PROCESSING;
THIN FILMS;
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EID: 0037393356
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/S0167-9317(02)00944-9 Document Type: Conference Paper |
Times cited : (11)
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References (12)
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