Modeling of adhesion in tablet compression - I. Atomic force microscopy and molecular simulation

Journal of Pharmaceutical Sciences

Volumn 92, Issue 4, 2003, Pages 798-814

  Wang, Jennifer J ^a   Li, Tonglei ^a   Bateman, Simon D ^b   Erck, Robert ^c   Morris, Kenneth R ^a  

^a PURDUE UNIVERSITY   (United States)

^b NOVARTIS PHARMA AG   (Switzerland)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Adhesion; And interfacial tension between solid surfaces; Atomic force microscopy (AFM); Contact area; Molecular simulation; Tablet compression

Indexed keywords

FLURBIPROFEN; IBUPROFEN; IRON; KETOPROFEN; SILICON NITRIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; MOLECULAR INTERACTION; MOLECULAR MODEL; MOLECULAR PROBE; SIMULATION; TABLET COMPRESSION; TABLET MANUFACTURE; VACUUM;

EID: 0037385054     PISSN: 00223549     EISSN: None     Source Type: Journal    
DOI: 10.1002/jps.10339     Document Type: Article

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