Measurement of critical exponents of platinum thin films

Surface Review and Letters

Volumn 10, Issue 1, 2003, Pages 1-5

  Salvadori, M C ^a   Melo, L L ^a   Cattani, M ^a   Monteiro, O R ^b   Brown, I G ^b  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Critical exponents; Platinum thin films

Indexed keywords

DEPOSITION; PLASMAS; PLATINUM; SCANNING TUNNELING MICROSCOPY;

METAL PLASMA ION DEPOSITION;

THIN FILMS;

PLATINUM; SILICON;

ARTICLE; DESORPTION; DYNAMICS; FILM; MEASUREMENT; NONLINEAR SYSTEM; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY;

EID: 0037322550     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X03004561     Document Type: Article

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