Critical exponent measurement of poor quality diamond films

Surface Review and Letters

Volumn 9, Issue 3-4, 2002, Pages 1409-1412

  Salvadori, M C ^a   Melo, L L ^a   Martins, D R ^a   Vaz, A R ^a   Cattani, M ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Critical exponents; Diamond films

Indexed keywords

DIAMOND; METHANE;

ARTICLE; ATOMIC FORCE MICROSCOPY; FILM; RAMAN SPECTROMETRY; SURFACE PROPERTY; THEORETICAL MODEL;

EID: 0036619425     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0218625x02004037     Document Type: Article

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