Critical exponents of diamond films: Possible influence of spatially correlated noise

Thin Solid Films

Volumn 376, Issue 1-2, 2000, Pages 264-266

  Cattani, M ^a   Salvadori, M C ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORRELATION METHODS; FILM GROWTH; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SPURIOUS SIGNAL NOISE; SURFACE ROUGHNESS; SYNTHESIS (CHEMICAL);

KARDAR-PARISI-ZHANG EQUATIONS; PLASMA ASSISTED CHEMICAL VAPOR DEPOSITION;

DIAMOND FILMS;

EID: 0034315601     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01400-0     Document Type: Article

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