NHx/OH surface groups in commercial Si3N4 powders analyzed by diffuse reflectance infrared Fourier transform (DRIFT) spectroscopy

Journal of the Ceramic Society of Japan

Volumn 111, Issue 1289, 2003, Pages 28-32

  Hien, Tran Thi Thu ^a   Ishizaki, Chanel ^a,b   Ishizaki, Kozo ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b Sinano Technology Corp   (Japan)

Author keywords

Diffuse reflectance infrared Fourier transform (DRIFT) spectroscopy; NH and NH2 content; Powder; Silicon nitride; Surface

Indexed keywords

DESORPTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN; MOLECULES; PRECIPITATION (CHEMICAL); REDUCTION; SILICON NITRIDE; THERMAL EFFECTS;

CARBOTHERMAL REDUCTION PROCESS;

POWDERS;

EID: 0037277634     PISSN: 09145400     EISSN: None     Source Type: Journal    
DOI: 10.2109/jcersj.111.28     Document Type: Article

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