Correlated analysis of deep level transient spectroscopy and thermally stimulated current spectra

Journal of Applied Physics

Volumn 93, Issue 1, 2003, Pages 390-395

  Menichelli, David ^a,b   Borchi, Emilio ^a,b  

^a Dipartimento di Energetica   (Italy)

^b INFM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; DATA REDUCTION; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC CURRENTS; INTEGRAL EQUATIONS; NEUTRON IRRADIATION; NUMERICAL METHODS;

THERMALLY STIMULATED CURRENTS (TSC);

SEMICONDUCTING SILICON;

EID: 0037249371     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1527219     Document Type: Article

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