Analysis of divacancy related traps induced by proton, neutron and gamma radiation in high resistivity silicon detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 426, Issue 1, 1999, Pages 120-125

  Eremin, V ^a   Ivanov, A ^a   Verbitskaya, E ^a   Li, Z ^b   Pandey, S U ^c  

^a IOFFE INSTITUTE   (Russian Federation)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c WAYNE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CHARGE CARRIERS; COMPUTER SIMULATION; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELDS; ENERGY GAP; GAMMA RAYS; NEUTRON IRRADIATION; PROTON IRRADIATION; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES;

SEMICONDUCTOR DETECTORS;

RADIATION DETECTORS;

EID: 0032681130     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(98)01479-X     Document Type: Article

References (9)

1. Feick H., Fretwurst E., Moll M., Lindström G. IEEE Trans. Nucl. Sci. NS-44:1997;825.
2. Biggeri U., Borchi E., Bruzzi M., Li Z., Verbitskaya E. Nucl. Phys. B (Proc. Suppl.). 61B:1998;475.
3. Li Z., Li C.J., Eremin V., Verbitskaya E. Nucl. Instr. and Meth. A. 388:1997;297.
4. Eremin V., Ivanov A., Verbitskaya E., Li Z., Schmidt B. IEEE Trans. Nucl. Sci. NS-44:1997;819.
5. van Lint V.A.J. Nucl. Instr. and Meth. A. 253:1987;453.
6. F.G. Wikner, D.K. Nichols, J. Nabor, T. Flanagan, H. Horiye, V.A.J. van Lint, "Transient Radiation Effects Final Report", DA-49-186-AMC-65(x)-1, Feb 1967.
7. Holmes R.R. IEEE Trans. Nucl. Sci. NS-17:1970;137.
8. Li Z., Ghislotti G., Kraner H.W., Li C.J., Nielsen B. IEEE Trans. Nucl. Sci. NS-43:1996;1590.
9. Li Z., Li C.J., Verbitskaya E. IEEE Trans. Nucl. Sci. NS-44:1997;834.