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Volumn 13, Issue 1, 2003, Pages 129-133

A simple deflection-testing method to determine Poisson's ratio for MEMS applications

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELASTIC MODULI; FINITE ELEMENT METHOD; POISSON DISTRIBUTION; THIN FILMS;

EID: 0037236460     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/13/1/318     Document Type: Article
Times cited : (33)

References (20)
  • 1
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    • Yi T and Kim C J 1999 Measurement of mechanical properties for MEMS materials Meas. Sci. Technol. 10 706-16
    • (1999) Meas. Sci. Technol. , vol.10 , pp. 706-716
    • Yi, T.1    Kim, C.J.2
  • 5
    • 0024771422 scopus 로고
    • Mechanical property measurements of thin films using load-deflection of composite rectangular films
    • Tabata O, Kawahata K, Sugiyama S and Igarashi I 1989 Mechanical property measurements of thin films using load-deflection of composite rectangular films Sensors Actuators 20 135-41
    • (1989) Sensors Actuators , vol.20 , pp. 135-141
    • Tabata, O.1    Kawahata, K.2    Sugiyama, S.3    Igarashi, I.4
  • 6
    • 0025541504 scopus 로고
    • Verification of FEM analysis of load-deflection methods for measuring mechanical properties of thin films Technical Digest
    • Hilton Head Island, SC, USA
    • Pan J Y, Lin P, Maseeh F and Senturia S D 1990 Verification of FEM analysis of load-deflection methods for measuring mechanical properties of thin films Technical Digest, IEEE Solid-State Sensor and Actuator Workshop Hilton Head Island, SC, USA p 70
    • (1990) IEEE Solid-State Sensor and Actuator Workshop , pp. 70
    • Pan, J.Y.1    Lin, P.2    Maseeh, F.3    Senturia, S.D.4
  • 7
    • 0026912033 scopus 로고
    • Computer-aided characterization of the elastic properties of thin films
    • Maier-Schneider D, Maibach J and Obermeier E 1992 Computer-aided characterization of the elastic properties of thin films J. Micromech. Microeng. 2 173-5
    • (1992) J. Micromech. Microeng. , vol.2 , pp. 173-175
    • Maier-Schneider, D.1    Maibach, J.2    Obermeier, E.3
  • 11
    • 0012510972 scopus 로고    scopus 로고
    • Poisson's ratio evaluation of LPCVD silicon nitride film Trans
    • Tabata O and Tsuchiya T 1996 Poisson's ratio evaluation of LPCVD silicon nitride film Trans. IEEE Japan 116 E 34-5
    • (1996) Trans. IEEE Japan , vol.116 E , pp. 34-35
    • Tabata, O.1    Tsuchiya, T.2
  • 12
    • 0031633288 scopus 로고    scopus 로고
    • A novel method to measure Poisson's ratio of thin films
    • Ziebart V, Paul O, Münch U and Baltes H 1998 A novel method to measure Poisson's ratio of thin films MRS Proc. 505 27-32
    • (1998) MRS Proc. , vol.505 , pp. 27-32
    • Ziebart, V.1    Paul, O.2    Münch, U.3    Baltes, H.4
  • 13
    • 0004272018 scopus 로고
    • (Englewood Cliffs, NJ: Prentice-Hall)
    • Hibbeler R C 1994 Mechanics of Materials (Englewood Cliffs, NJ: Prentice-Hall) p 134
    • (1994) Mechanics of Materials , pp. 134
    • Hibbeler, R.C.1
  • 16
    • 0000968175 scopus 로고    scopus 로고
    • Fabrication of photoplastic high-aspect ratio microparts and micromolds using SU-8 UV resist
    • Lorenz H, Despont M and Renaud P 1998 Fabrication of photoplastic high-aspect ratio microparts and micromolds using SU-8 UV resist Microsyst. Technol. 4 143-6
    • (1998) Microsyst. Technol. , vol.4 , pp. 143-146
    • Lorenz, H.1    Despont, M.2    Renaud, P.3
  • 18
    • 0012508336 scopus 로고    scopus 로고
    • SOTEC MICROSYSTEMS SA, Switzerland
    • SOTEC MICROSYSTEMS SA, Switzerland (http://www.somisys.ch/properties.htm)
  • 19
    • 0030435042 scopus 로고    scopus 로고
    • Surface engineering and microtribology for microelectromechanical systems
    • Komvopoulos K 1996 Surface engineering and microtribology for microelectromechanical systems Wear 200 305-27
    • (1996) Wear , vol.200 , pp. 305-327
    • Komvopoulos, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.