Bias dependent apparent height of an Al2O3 thin film on NiAl(1 1 0), and of supported Pd clusters

Surface Science

Volumn 475, Issue 1-3, 2001, Pages 96-102

  Hojrup Hansen K ^a   Worren, T ^a   Laegsgaard E ^a   Besenbacher, F ^a   Stensgaard, I ^a  

^a AARHUS UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INSULATING MATERIALS; ELECTRON TUNNELING; NICKEL ALLOYS; PALLADIUM; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

INSULATING FILMS;

ALUMINA;

EID: 0002683071     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)01077-3     Document Type: Article

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