메뉴 건너뛰기




Volumn 516, Issue 3, 2002, Pages

Formation of atomically flat Si(0 0 1) surface with incorporated carbon

Author keywords

Alkynes; Carbon; Scanning tunneling microscopy; Silicon; Surface relaxation and reconstruction

Indexed keywords

CARBON; CRYSTAL ORIENTATION; DISSOCIATION; MOLECULAR BEAM EPITAXY; MONOLAYERS; RELAXATION PROCESSES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; THIN FILMS;

EID: 0037144343     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02056-3     Document Type: Article
Times cited : (7)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.