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Journal of Applied Physics

Volumn 80, Issue 10, 1996, Pages 5748-5752

X-ray photoelectron spectroscopic investigation of carbon incorporation and segregation during pseudomorphic growth of Si1-yCy on Si(001)

(3) Kim, Myeongcheol a Lippert, G a Osten, H J a

a IHP (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009984687 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.363569 Document Type: Review

Times cited : (29)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.