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Thin Solid Films

Volumn 307, Issue 1-2, 1997, Pages 38-42

Correlation between microstructure and the optical properties of Tio2 thin films prepared on different substrates

(5) Leprince Wang, Y a,b Yu Zhang, K b Nguyen Van, V a Souche, D a Rivory, J a

a CNRS (France)

b UNIVERSITÉ GUSTAVE EIFFEL (France)

Author keywords

Ellipsometry; Optical coatings; TEM; Titanium oxide

Indexed keywords

CRYSTAL MICROSTRUCTURE; DEPOSITION; ELECTRON BEAMS; EVAPORATION; FILM GROWTH; FUSED SILICA; GLASS; MORPHOLOGY; REFRACTIVE INDEX; SILICON WAFERS; THIN FILMS; TITANIUM DIOXIDE;

FLOAT GLASS;

OPTICAL FILMS;

EID: 0031251532 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00293-9 Document Type: Article

Times cited : (70)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.