Synchrotron photoemission characterization of TiO2 supported on SiO2

Langmuir

Volumn 14, Issue 17, 1998, Pages 4908-4914

  Espinos J P ^a   Lassaletta, G ^a   Caballero, A ^a   Fernandez A ^a   Gonzalez Elipe A R ^a   Stampfl, A ^b   Morant, C ^c   Sanz, J M ^c  

^a UNIVERSITY OF SEVILLE   (Spain)

^b LA TROBE UNIVERSITY   (Australia)

^c INSTITUTO NICOLÁS CABRERA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS FILMS; BINDING ENERGY; CHEMICAL BONDS; ENERGY GAP; PHOTOEMISSION; PHOTONS; SILICA; SYNCHROTRON RADIATION; TITANIUM DIOXIDE; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; X RAY ABSORPTION NEAR-EDGE SPECTROSCOPY (XANES);

INTERFACES (MATERIALS);

EID: 0032135934     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980280k     Document Type: Article

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