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Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 16, 2002, Pages 1654361-1654369

Lattice strain and static disorder in hydrogen-implanted and annealed single-crystal silicon as determined by large-angle convergent-beam electron diffraction

(1) Frabboni, Stefano a

a UNIVERSITY OF MODENA AND REGGIO EMILIA (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

HYDROGEN; SILICON;

ARTICLE; ATOMIC PARTICLE; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; LOW TEMPERATURE; SURFACE PROPERTY; TEMPERATURE DEPENDENCE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0037091445 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (7)

References (22)

1
- 0001633346
- Hydrogen in semiconductors
- edited by J. I. Pankove and N. M. Johnson (Academic, Boston)
- (1991) Semiconductors and Semimetals , vol.34

2
- 0000002517
- (1992) Phys. Rev. B , vol.46 , pp. 2061
- Cerofolini, G.F.¹ Meda, L.² Balboni, R.³ Corni, F.⁴ Frabboni, S.⁵ Ottaviani, G.⁶ Tonini, R.⁷ Anderle, M.⁸ Canteri, R.⁹

3
- 0001876902
- (2000) Mater. Sci. Eng., R. , vol.237 , pp. 1
- Cerofolini, G.F.¹ Corni, F.² Frabboni, S.³ Nobili, C.⁴ Ottaviani, G.⁵ Tonini, R.⁶

4
- 0029637854
- (1995) Electron. Lett. , vol.31 , pp. 1201
- Bruel, M.¹

5
- 0029352741
- (1995) Phys. Status Solidi A , vol.150 , pp. 539
- Cerofolini, G.F.¹ Balboni, R.² Bisero, D.³ Corni, F.⁴ Frabboni, S.⁵ Ottaviani, G.⁶ Tonini, R.⁷ Brusa, R.S.⁸ Zecca, A.⁹ Ceschini, M.¹⁰ Giebel, G.¹¹ Pavesi, L.¹²

6
- 0000490155
- (1998) J. Appl. Phys. , vol.83 , pp. 4106
- Bisero, D.¹ Corni, F.² Frabboni, S.³ Tonini, R.⁴ Ottaviani, G.⁵ Balboni, R.⁶

7
- 0342727389
- (1997) J. Vac. Sci. Technol. B , vol.15 , pp. 1065
- Weldon, M.K.¹ Marsico, V.E.² Chabal, Y.J.³ Agarwal, A.⁴ Eaglesham, D.J.⁵ Sapjeta, J.⁶ Brown, W.L.⁷ Jacobson, D.C.⁸ Caudano, Y.⁹ Christman, S.B.¹⁰ Chaban, E.E.¹¹

8
- 4244065232
- (1999) Phys. Rev. Lett. , vol.82 , pp. 4870
- Reboredo, F.A.¹ Ferconi, M.² Pantelides, S.T.³

9
- 0000174598
- (1970) Phys. Rev. B , vol.1 , pp. 1306
- Dederichs, P.H.¹

10
- 36149050546
- (1973) J. Phys. F: Met. Phys. , vol.3 , pp. 471
- Dederichs, P.H.¹

11
- 0009126874
- (1986) J. Electron Microsc. , vol.35 , pp. 314
- Tanaka, M.¹

12
- 0009204616
- (1998) Phys. Rev. Lett. , vol.81 , pp. 3155
- Frabboni, S.¹ Gambetta, F.²

13
- 0010638977
- (1994) Philos. Mag. A , vol.70 , pp. 1091
- Duan, X.F.¹ Cherns, D.² Steeds, W.³

14
- 4243952680
- (1999) Phys. Rev. B , vol.60 , pp. 13750
- Frabboni, S.¹ Gambetta, F.² Armigliato, A.³ Balboni, R.⁴ Balboni, S.⁵ Cembali, F.⁶

15
- 0003545679
- North-Holland, Amsterdam
- (1990) Diffraction Physics
- Cowley, J.M.¹

16
- 0038857074
- (1998) Philos. Mag. A , vol.77 , pp. 67
- Balboni, R.¹ Frabboni, S.² Armigliato, A.³

17
- 3943074861
- (1987) Nucl. Instrum. Methods Phys. Res. B , vol.19-20 , pp. 443
- Servidori, M.¹

18
- 36849104521
- (1973) J. Appl. Phys. , vol.44 , pp. 534
- Brantley, W.A.¹

19
- 0001163989
- (1988) Appl. Phys. Lett. , vol.53 , pp. 1735
- Jeng, S.J.¹ Oehrlein, G.S.² Scilla, G.J.³

20
- 0001070560
- (2000) Appl. Phys. Lett. , vol.76 , pp. 852
- Grisolia, J.¹ Assayag, G.² Ben³ Claverie, A.⁴ Aspar, B.⁵ Lagahe, C.⁶ Laanab, L.⁷

21
- 0000245567
- (2000) J. Appl. Phys. , vol.88 , pp. 2278
- Nordlund, K.¹ Partyca, P.² Averback, R.S.³ Robinson, I.K.⁴ Ehrhart, P.⁵

22
- 0001051163
- (1997) Phys. Rev. B , vol.55 , pp. 14279
- Tang, M.¹ Colombo, L.² Zhu, J.³ Diaz de la Rubia, T.⁴

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