Current transport in interface-engineered high-Tc Josephson junctions

Physica C: Superconductivity and its Applications

Volumn 367, Issue 1-4, 2002, Pages 260-266

  Yoshida, J ^a   Katsuno, H ^a   Inoue, S ^a   Nagano, T ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

Andreev reflection; Interface engineered junction; Josephson junction; Micro constriction; Transport mechanisms

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC CONDUCTANCE; INTERFACES (MATERIALS); SUPERCONDUCTIVITY; THERMAL EFFECTS;

CURRENT TRANSPORT;

JOSEPHSON JUNCTION DEVICES;

EID: 0037082795     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(01)01048-6     Document Type: Article

References (19)