Influence of La-doping of YBa2Cu3O7 on transport properties of interface-engineered ramp-edge junctions

IEEE Transactions on Applied Superconductivity

Volumn 11, Issue 1 I, 2001, Pages 795-798

  Heinsohn, J K ^a   Dittmann, R ^a   Rodriguez Contreras J ^a   Scherbel, J ^a   Klushin, A ^a   Siegel, M ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

Interface engineering; Josephson junctions

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRODES; HIGH TEMPERATURE SUPERCONDUCTORS; LANTHANUM; OPTIMIZATION; SUPERCONDUCTING FILMS; TEMPERATURE; YTTRIUM BARIUM COPPER OXIDES;

INTERFACE ENGINEERING; MICROWAVE CURRENT; SHEET RESISTANCES; THIN FILM ELECTRODES;

JOSEPHSON JUNCTION DEVICES;

EID: 0035269080     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919465     Document Type: Conference Paper

References (16)

1. c Josephson junctions
2. High-resistance HTS edge junctions for digital circuits
3. 7-x ramp-type Josephson junctions
4. Preparation of ramp-edge Josephson junctions with natural barriers
5. High-temperature superconducting edge-type Josephson junctions with modified interfaces
6. 7 ramp-type junctions by interface treatments
7. c Josephson junction studied by transmission electron microscopy
8. Effects of process parameters on the fabrication of edge-type YBCO Josephson junctions by interface treatments
9. Inelastic tunneling across thin amorphous films
10. Stationary properties of high-critical-temperature proximity effect Josephson junctions
11. Superconductor-normal-superconductor step-edge junctions with Au barriers
12. Current voltage characteristics of Josephson junctions
13. Effect of ac impedance on dc voltage-current characteristics of superconductor weak-link junctions
14. Influence of microwave radiation on current-voltage characteristic of superconducting weak links
15. Josephson effect on YBCO break junctions