Structure characterization of porous silicon layers based on a theoretical analysis

Langmuir

Volumn 18, Issue 10, 2002, Pages 4165-4170

  Xiao, Caide ^a   Boukherroub, Rabah ^a   Wojtyk, James T C ^a   Wayner, Danial D M ^a   Luong, John H T ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; PHOTOLUMINESCENCE; POROSITY; POROUS MATERIALS; REFRACTIVE INDEX;

POROUS SILICON LAYERS;

SILICON;

EID: 0037076632     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la025508p     Document Type: Article

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