Size distribution of atomic clusters in a model of strained submonolayer

Molecular Physics

Volumn 100, Issue 19, 2002, Pages 3151-3154

  Tokar, V I ^a   Dreysse, Hugues ^b  

^a INSTITUTE OF MAGNETISM   (Ukraine)

^b INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATION THEORY; COMPUTER SIMULATION; DEPOSITION; HAMILTONIANS; MONTE CARLO METHODS; NANOSTRUCTURED MATERIALS; SEMICONDUCTOR QUANTUM DOTS; STATISTICS;

ATOMIC CLUSTERS;

MONOLAYERS;

EID: 0037058159     PISSN: 00268976     EISSN: None     Source Type: Journal    
DOI: 10.1080/00268970210139930     Document Type: Article

References (24)

1. Ghaisas, S.V., and Mudhukar, A., 1989, J. Vacuum Sci. Technol. B, 7, 264.
2. Ibach, H., 1997, Surface Sci. Rep., 29, 193.
3. Van Der Merwe, J.H., Tönsing, D.L., and Stoop, P.M., 1994, Surface Sci., 312, 387.
4. Henzler, M., 1996, Surface Sci., 357-358, 809.
5. Nötzel, R., 1996, Semicond. Sci. Technol., 11, 1365.
6. Shchukin, V.A., and Bimberg, D., 1999, Rev. mod. Phys., 71, 1125.
7. Shchukin, V.A., 2001, NATO Advanced Research Workshop on Atomistic Aspects of Epitaxial Growth, 25-30 June, Corfu, Greece.
8. Ratsch, C., and Zangwill, A., 1993, Surface Sci., 293, 123.
9. Korutcheva, E., Turiel, A.M., and Markov, I., 2000, Phys. Rev. B, 61, 16890.
10. Orr, B.G., Kessler, D., Snyder, C., and Sander, L., 1992, Europhys. Lett., 19, 33.
11. Erwin, S.C., Baski, A.A., Whitman, L.J., and Rudd, R.E., 1999, Phys. Rev. Lett., 83, 1818.
12. Khor, K.E., and Sarma, S.D., 2000, Phys. Rev. B, 62, 16657.
13. Joyce, P.B. et al., 1998, Phys. Rev. B, 58, R15981.
14. Jesson, D.E., Kästner, M., and Voigtländer, B., 2000, Phys. Rev. Lett., 84, 330.
15. Leonard, D., Krishnamurthy, M. et al., 1990, Appl. Phys. Lett., 57, 2110.
16. Tokar, V.I., and Dreyssé, H., 2002, Comp. Mat. Sci., in press.
17. Binder, K., 1986, Monte Carlo Methods in Statistical Physics, 2nd Erin (Heidelberg: Springer-Verlag).
18. Priester, C., and Lannoo, M., 1995, Phys. Rev. Lett., 75, 93.
19. Kim, C.S. et al., 2000, Phys. Rev. Lett., 85, 1124.
20. Berti, M., Drigo, A.V., Rossetto, G., and Torzo, G., 1997, J. Vacuum Sci. Technol. B, 15, 1794.
21. Wang, L.G., Kratzer, P., Moll, N., and Scheffler, M., 2000, Phys. Rev. B, 62, 1897.
22. Bhatti, A.S. et al., 1999, Phys. Rev. Lett., 60, 2592.
23. Heitz, R. et al., 1997, Phys. Rev. Lett., 78, 4071.
24. Snyman, J.A., and Van Der Merwe, J.H., 1974, Surface Sci., 45, 619.