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Volumn 416, Issue 1-2, 2002, Pages 97-105

Phase modulated spectroscopic ellipsometry of dielectric multilayer beam combiner

Author keywords

Beam; Dielectric; Spectroscopic ellipsometry

Indexed keywords

ALGORITHMS; DIELECTRIC FILMS; ELLIPSOMETRY; MULTILAYERS; REFRACTIVE INDEX; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS;

EID: 0037009693     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(02)00729-0     Document Type: Article
Times cited : (9)

References (45)
  • 1
    • 0011107597 scopus 로고    scopus 로고
    • F.R. Flory (Ed.), Marcell Dekker Inc., NY, 1995, p. 1
    • H.A. Macleod, in: F.R. Flory (Ed.), Marcell Dekker Inc., NY, 1995, p. 1.
    • Macleod, H.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.