Heavy ion RBS characterization of multilayer coatings deposited through the sol-gel technique

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 118, Issue 1-4, 1996, Pages 630-632

  Aslanoglou, X ^a   Assimakopoulos, P A ^a   Trapalis, C ^b   Kordas, G ^b   Karakassides, M A ^b   Pilakouta, M ^c  

^a UNIVERSITY OF IOANNINA   (Greece)

^b INSTITUTE OF MATERIALS SCIENCE   (Greece)

^c INSTITUTE OF NUCLEAR PHYSICS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COATINGS; DIELECTRIC FILMS; GLASS; MASS SPECTROMETRY; MULTILAYERS; OXIDES; SOL-GELS; SPECTROSCOPIC ANALYSIS; STRUCTURE (COMPOSITION); SURFACES; THIN FILMS;

GLASS SURFACES; MULTILAYER COATINGS; SOL GEL TECHNIQUE; WAVELENGTH SELECTIVITY;

RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 0030565105     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01080-7     Document Type: Article

References (9)

1. W.K. Chu, J.W. Mayer and M.A. Nicolet, in: Backscattering Spectrometry (Academic Press, New York, 1978).
2. K.M. Yu, J.M. Jaklevic and E.E. Haller, Nucl. Instr. and Meth B 10/11 (1985) 606.
3. M. Döbeli, U.S. Fischer, M. Suter and W. Wölfi, Nucl. Instr. and Meth. B 63 (1992) 68.
4. E. Norbeck, L.W. Li, H.H. Lin and M.E. Anderson, Nucl. Instr. and Meth. B 9 (1985) 197.
5. M. Östling, C.S. Petersson, P. Johansson, A. Wikström and G. Possnert, Nucl. Instr. and Meth. B 15 (1986) 729.
6. P. Biswas, D. Kundu and D. Ganguli, J. Mater. Sci. Lett. 6 (1987) 1481.
7. D. Kundu, P. Biswas and D. Ganguli, J. Non-Cryst. Solids 110 (1989) 13.
8. H. Dislich and E. Hussmann, Thin Solid Films 77 (1981) 129.
9. J.F. Ziegler, J.P. Biersack and U. Littmark, The Stopping and Range of the Ions in Matter, Vol. 5 (Pergamon, New York, 1980).