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Volumn 1, Issue , 2002, Pages 311-315

Synthesis of C-axis oriented AlN thin films on metal layers: Al, Mo, Ti, TiN and Ni.

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ALUMINUM NITRIDE; ELECTRODES; MAGNETRON SPUTTERING; MOLYBDENUM; NICKEL; PIEZOELECTRIC MATERIALS; SYNTHESIS (CHEMICAL); TEXTURES; THIN FILMS; TITANIUM; TITANIUM NITRIDE;

EID: 0036992226     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (17)

References (7)
  • 7
    • 0013240345 scopus 로고    scopus 로고
    • Effect of an ion bombardment on structural and morphological properties of TiN and AlN layers: Application to the improvement of interfacial properties of TiN/AlN multilayers
    • Paris, France; (Soc. Francaise du Vide)
    • C. Rousselot, A. Thobor, and N. Martin, in Effect of an ion bombardment on structural and morphological properties of TiN and AlN layers: application to the improvement of interfacial properties of TiN/AlN multilayers, Paris, France, 2000 (Soc. Francaise du Vide), p. 210-12.
    • (2000) , pp. 210-212
    • Rousselot, C.1    Thobor, A.2    Martin, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.