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Volumn 17, Issue 6, 2002, Pages 1469-1475

Reactive sputter deposition of highly oriented AIN films at room temperature

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONS; FILM GROWTH; ION BOMBARDMENT; SPUTTER DEPOSITION; TEXTURES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0036602357     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/jmr.2002.0218     Document Type: Article
Times cited : (99)

References (31)
  • 15
    • 0029306594 scopus 로고    scopus 로고
    • The characterization of sputtered polycrystalline aluminum nitride on silicon by surface acoustic wave measurements
    • IEEE UFFC, 1995 , pp. 404-409
    • Liaw, H.M.1
  • 25
    • 0005859184 scopus 로고    scopus 로고
    • Dissertation No. 711, Linköping University, Sweden
    • (2001)
    • Tungasmita, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.