Radiation tolerance of prototype BTeV pixel detector readout chips

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 2895-2901

  Chiodini, G ^a   Appel, J A ^a   Cardoso, G ^a   Christian, D C ^a   Coluccia, M R ^a   Hall, B ^a   Hoff, J ^a   Kwan, S W ^a   Mekkaoui, A ^a   Yarema, R ^a   Zimmerman, S ^a   Uplegger, L ^b  

^a FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

^b INFN SEZIONE DI MILANO   (Italy)

Author keywords

Proton irradiation; Single event effects

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; PROTON BEAMS; PROTON IRRADIATION; RADIATION DETECTORS; READOUT SYSTEMS;

READOUT CHIPS;

NUCLEAR PHYSICS;

EID: 0036952679     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805444     Document Type: Conference Paper

References (11)

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