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Volumn 473, Issue 1-2, 2001, Pages 152-156

FPIX2: A radiation-hard pixel readout chip for BTeV

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; IRRADIATION; RADIATION HARDENING; SOFTWARE PROTOTYPING;

EID: 0035500706     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(01)01137-8     Document Type: Conference Paper
Times cited : (32)

References (9)
  • 5
    • 0035500980 scopus 로고    scopus 로고
    • these proceedings. Michael Campbell reviewed both radiation damage in CMOS circuits as a function of feature size, and the techniques used to design readiation tolerant circuits using deep-submicron CMOS
    • (2001) Nucl. Instr. and Meth. A , vol.473 , pp. 140
    • Campbell, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.