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Volumn 81, Issue 8, 1997, Pages 3526-3536

Differences in the densities of charged defect states and kinetics of Staebler-Wronski effect in undoped (nonintrinsic) hydrogenated amorphous silicon thin films

(2) Güneş, Mehmet a Wronski, Christopher R b

a IZMIR INSTITUTE OF TECHNOLOGY (Turkey)

b PENNSYLVANIA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0342341417 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.365000 Document Type: Article

Times cited : (40)

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