Characterization of amorphous silicon solar cell preparation processes by real time spectroscopic ellipsometry

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1996, Pages 1035-1040

  Collins, R W ^a   Koh, Joohyun ^a   Lu, Yiwei ^a   Kim, Sangbo ^a   Burnham, J S ^a   Wronski, C R ^a  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; BAND STRUCTURE; CHARACTERIZATION; ELLIPSOMETRY; ENERGY GAP; HETEROJUNCTIONS; INTERFACES (MATERIALS); PERFORMANCE;

AMORPHOUS SILICON SOLAR CELL; CODEPOSITED CELLS; OPEN CIRCUIT VOLTAGES; OPTICAL GAP; REAL TIME SPECTROSCOPIC ELLIPSOMETRY;

SILICON SOLAR CELLS;

EID: 0030412045     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/pvsc.1996.564307     Document Type: Conference Paper

References (9)