Optical depth profiling of band gap engineered interfaces in amorphous silicon solar cells at monolayer resolution

Applied Physics Letters

Volumn 72, Issue 23, 1998, Pages 2993-2995

  Fujiwara, H ^a   Koh, Joohyun ^a   Wronski, C R ^a   Collins, R W ^a   Burnham, J S ^b  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000258566     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121518     Document Type: Article

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