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Volumn 729, Issue , 2002, Pages 205-213
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Low-temperature LPCVD MEMS technologies
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING;
CHEMICAL VAPOR DEPOSITION;
CMOS INTEGRATED CIRCUITS;
LOW TEMPERATURE EFFECTS;
MECHANICAL PROPERTIES;
MICROELECTROMECHANICAL DEVICES;
PRESSURE EFFECTS;
LOW PRESSURE CHEMICAL VAPOR DEPOSITION;
MICROMECHANICAL STRUCTURES;
POST-DEPOSITION ANNEALING;
POLYSILICON;
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EID: 0036924806
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-729-u5.1 Document Type: Conference Paper |
Times cited : (12)
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References (26)
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