Design for fault-tolerance in system ES model 900

FTCS 1992 - 22nd Annual International Symposium on Fault-Tolerant Computing

Volumn , Issue , 1992, Pages 38-47

  Spainhower, L ^a   Isenberg, J ^a   Chillarege, R ^a   Berding, J ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ECONOMIC AND SOCIAL EFFECTS; ERROR DETECTION; FAULT DETECTION; INTEGRATED CIRCUIT DESIGN; REPAIR;

CENTRAL PROCESSORS; CIRCUIT LEVELS; CONCURRENT ERROR DETECTION; FAULT IDENTIFICATIONS; FAULT TOLERANCE TECHNIQUES; GRACEFUL DEGRADATION; REPAIR PROCESS; SYSTEM LEVELS;

FAULT TOLERANCE;

EID: 84987170878     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FTCS.1992.243617     Document Type: Conference Paper

References (11)

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