128 Kb SRAM with soft error immunity for 0.35 μm SOI-CMOS embedded cell arrays

IEEE International SOI Conference

Volumn , Issue , 1998, Pages 127-128

  Wada, Yoshiki ^a   Nii, Koji ^a   Kuriyama, Hirotada ^a   Maeda, Shigenobu ^a   Ueda, Kimio ^a   Matsuda, Yoshio ^a  

^a MITSUBISHI ELECTRIC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLES; ARRAYS; CMOS INTEGRATED CIRCUITS; SILICON ON INSULATOR TECHNOLOGY;

EMBEDDED CELL ARRAYS; SOFT ERROR IMMUNITY; STATIC RANDOM ACCESS MEMORY (SRAM);

RANDOM ACCESS STORAGE;

EID: 0032318112     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)