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Volumn 20, Issue 5, 2000, Pages 61-69

High availability and reliability in the Itanium processor

Author keywords

[No Author keywords available]

Indexed keywords

ERROR CORRECTING CODES (ECC); MACHINE CHECK ABORT (MCA) ARCHITECTURE;

EID: 0034273728     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/40.877951     Document Type: Article
Times cited : (78)

References (6)
  • 2
    • 0028112725 scopus 로고
    • On latching probability of particle induced transients in combinational networks
    • IEEE Press, Piscataway, N.J.
    • P. Liden et al., "On Latching Probability of Particle Induced Transients in Combinational Networks," Proc. Symp. Fault Tolerant Computing (FTCS-24), IEEE Press, Piscataway, N.J., 1994, pp. 340-349.
    • (1994) Proc. Symp. Fault Tolerant Computing (FTCS-24) , pp. 340-349
    • Liden, P.1
  • 4
    • 0021392066 scopus 로고
    • Error correcting codes for semiconductor memory applications: A state-of-the-art review
    • Mar.
    • C.L. Chen and M.Y. Hsiao, "Error Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review," IBM J. Research and Development, Vol. 28, No. 2, Mar. 1984.
    • (1984) IBM J. Research and Development , vol.28 , Issue.2
    • Chen, C.L.1    Hsiao, M.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.