Microscopic model for creation and removal of metastable dangling bonds in a-Si:H

Materials Research Society Symposium - Proceedings

Volumn 715, Issue , 2002, Pages 413-422

  Powell, M J ^a   Deane, S C ^a   Wehrspohn, R B ^b  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SPIN RESONANCE SPECTROSCOPY; HYDROGEN BONDS; HYDROGENATION; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;

MECHANICAL STRESS; METASTABLE DANGLING BONDS;

AMORPHOUS SILICON;

EID: 0036913930     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-715-a11.1     Document Type: Conference Paper

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