Evidence for existence of hydrogen-related dangling bonds in hydrogenated amorphous silicon

Philosophical Magazine Letters

Volumn 73, Issue 5, 1996, Pages 283-287

  Yokomichi, Haruo ^a   Morigaki, Kazuo ^b  

^a TOYAMA PREFECTURAL UNIVERSITY   (Japan)

^b HIROSHIMA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL ATOMIC STRUCTURE; HYDROGENATION; NATURAL FREQUENCIES;

DANGLING BONDS; ELECTRON NUCLEAR DOUBLE RESONANCE; HYPERFINE INTERACTION CONSTANT; NUCLEUS;

AMORPHOUS SILICON;

EID: 0030134829     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008396180777     Document Type: Article

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