SPIRIT: A highly robust combinational test generation algorithm

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 21, Issue 12, 2002, Pages 1446-1458

  Gizdarski, Emil ^a   Fujiwara, Hideo ^b  

^a SYNOPSYS INC   (United States)

^b NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

Boolean satisfiability; Static and dynamic learning; Stuck at faults; Test generation

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; DATA STRUCTURES; GRAPH THEORY; HEURISTIC METHODS; PATTERN RECOGNITION;

ELECTRONIC DESIGN AUTOMATION (EDA);

COMBINATORIAL CIRCUITS;

EID: 0036913522     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2002.804387     Document Type: Article

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