SPIRIT: A highly robust combinational test generation algorithm

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 2001, Pages 346-351

  Gizdarski, Emil ^a   Fujiwara, Hideo ^b  

^a SYNOPSYS INC   (United States)

^b NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; BOOLEAN FUNCTIONS; COMBINATORIAL CIRCUITS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; FAILURE ANALYSIS; LOGIC GATES;

AUTOMATIC TEST PATTERN GENERATION; BOOLEAN SATISFIABILITY METHOD; COMBINATORIAL TEST GENERATION;

INTEGRATED CIRCUIT TESTING;

EID: 0034995343     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2002.804387     Document Type: Article

References (23)

1. A transitive closure algorithm for test generation
2. ITC'99 benchmark circuits - Preliminary results
3. A new data structure for complete implication graph with application for static learning
4. SPIRIT: Satisfiability problem implementation for redundancy identification and test generation
5. An implicit enumeration algorithm to generate tests for combinational logic circuits
6. Algorithms for solving Boolean satisfiability in combinational circuits
7. On the acceleration of test generation algorithms
8. The complexity of fault detection for combinational logic circuits
9. New techniques for deterministic test pattern generation
10. A single-path-oriented fault-effect propagation in digital circuits considering multiple-path sensitization
11. A small test generation for large designs
12. Recursive learning: A new implication technique for efficient solutions to CAD problems - Test, verification, and optimization
13. Test pattern generation using Boolean satisfiability
14. Evidence for a satisfiability threshold for random 3CNF formulas
15. CONTEST: A fast ATPG tool for very large combinational circuits
16. Dynamic search pruning techniques in path sensitization
17. A nine-value logic model for test generation
18. Why is ATPG easy?
19. A method to calculate necessary assignments in algorithmic test generation
20. SOCRATES: A highly efficient automatic test pattern generation system
21. Combinational test generation using satisfiability
22. SAT based ATPG using fast justification and propagation in the implication graph
23. STAR-ATPG: A high speed test pattern generator for large scan designs