Simulations of X-ray photoelectron diffraction for polytype analysis

Surface Science

Volumn 515, Issue 1, 2002, Pages 126-134

  Winkelmann, Aimo ^a   Schröter, Bernd ^a   Richter, Wolfgang ^a  

^a FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Computer simulations; Photoelectron diffraction; Silicon carbide; Single crystal surfaces

Indexed keywords

COMPUTER SIMULATION; MOLECULAR BEAM EPITAXY; SINGLE CRYSTALS; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

X-RAY PHOTOELECTRON DIFFRACTION (XPD);

SILICON CARBIDE;

EID: 0036682617     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)01850-2     Document Type: Article

References (22)

1. Properties of silicon carbide