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Volumn 482-485, Issue PART 1, 2001, Pages 593-599

X-ray photoelectron diffraction from cubic GaN(0 0 1): An experimental and theoretical study

Author keywords

Computer simulations; Gallium nitride; Low index single crystal surfaces; Photoelectron diffraction measurement

Indexed keywords

COMPUTER SIMULATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; GALLIUM NITRIDE; INTERFACES (MATERIALS); SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0035918921     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)01049-9     Document Type: Conference Paper
Times cited : (9)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.