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Volumn 482-485, Issue PART 1, 2001, Pages 593-599
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X-ray photoelectron diffraction from cubic GaN(0 0 1): An experimental and theoretical study
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Author keywords
Computer simulations; Gallium nitride; Low index single crystal surfaces; Photoelectron diffraction measurement
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Indexed keywords
COMPUTER SIMULATION;
CRYSTALLOGRAPHY;
ELECTRON DIFFRACTION;
GALLIUM NITRIDE;
INTERFACES (MATERIALS);
SUBSTRATES;
X RAY PHOTOELECTRON SPECTROSCOPY;
LOW INDEX SINGLE CRYSTAL SURFACES;
X-RAY PHOTOELECTRON DIFFRACTION;
SINGLE CRYSTALS;
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EID: 0035918921
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(00)01049-9 Document Type: Conference Paper |
Times cited : (9)
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References (12)
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